2000A, Portable Emissometer/Reflectometer
AZ Technology's TEMP 2000A handheld emissometer/reflectometer give emittance measurements in accordance with ASTM E408 and is the recognized replacement for an aging Gier-Dunkle DB100 as suggested on page 23 of the following 2005 NASA Technical Paper,
"The simplest method of determining emittance is with a portable infrared reflectometer such as the [Gier Dunkle] DB100 or the AzTek [AZ Technology] Temp 2000."
|-- Kauder, L. (2005) NASA/TP-2005-212792, pg. 23.
|[AzTeK was previous AZ Technology Logo]
Note: ASTM C1371 is justified via comparisons to E408 and C835 and does not replace them.
Lab setting with sample puck on top of unit.
Portable usage measuring concrete product
Technology TEMP 2000A Portable Emissometer/Reflectometer
compact, lightweight, rugged, and ergonomically
engineered for ease of use in the field
or in the laboratory to determine ambient temperature total emittance.
The TEMP 2000A can be conveniently used in a laboratory setting (top right image) where samples can be sat atop the instrument and left while repeated measurements are being taken. The TEMP 2000A can be used as a portable unit (bottom right image) via use of a battery pack and vest.
The TEMP 2000A, by virtue of an advanced
optical system, provides a portable emissometer/reflectometer
that performs total hemispheric reflectance
measurements from less than 3 to greater
than 35 micrometers wavelength and is not
limited in wavelength range due to filters,
windows, or coatings, placed in the optical
path. The TEMP 2000A optical system has
been designed to minimize losses, to facilitate
and maintain optical alignment, and to utilize
the features of AZ Technology's patented
ellipsoid collector (US
Patent Number 5,659,397) that allows compactness
for portability, efficiency, and measurement
accuracy. The TEMP 2000A provides improved
performance and maintainability over the
no longer produced Gier Dunkle DB-100 IR Reflectometer** and
in accordance with the ASTM E408 standard.
The table below lists specifications for the TEMP 2000A.
||<3um to >35um (not limited by filters,
|Measurement accuracy (for specular and diffuse samples)
||- ± 1% of full scale for gray samples
- ± 3% of full scale for non-gray samples
||- ± 0.5% of full scale or better
||Any Sample, including foils, insulators,
|Sample size and geometry
||-Flat Surfaces: ≥ 0.4 inches (1 cm) diameter
-Concave Surfaces: ≥ 6.5
inches (16.5 cm) diameter
-Convex Surfaces: ≥ 1 inch
(2.5 cm) diameter
||Room Temperature, Ambient
-Normal Emittance (300K)
-Hemispheric emittance (300K)
-Digital LCD panel meter
-Selectable IR emittance or reflectance
|Measurement range (reflectance)
||0.00 to 1.00
-Optical Head: 5.25" diameter x
-Control and Display Unit: 4.5 x 7.75
x 7 inches
-Carry Case: 12.5 x 17 x 11 inches
||1 year parts and labor
*Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably. **TEMP 2000A represents an excellent cost-effective option for replacing a Gier Dunkle DB100 while increasing portability. (Alternative to SOC, 410, 400T, directional reflectometer, ET100, ET10, Surface Optics, Portable emmisometer.)