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Optical Properties Measurement Instruments

 

AZ Technology's unique line of highly accurate portable and laboratory portable instruments for measuring the optical properties of materials; specifically, solar absorption, emittance, reflectance, and transmittance are summarized below with links to more detailed information. AZ Technology also has the expertise and experience to custom develop related instruments. Many of these instruments were developed with NASA as described in the most recent 2009 NASA Spinoff Report.

   
       
Optical Properties Measurement Instruments:
- LPSR 300:

Laboratory Portable SpectroReflectometer (LPSR) is a unique integrating sphere instrument for easily and quickly measuring total hemispherical spectral reflectance from 250 to 2800 nm (most surfaces). This laboratory portable spectral reflectometer measures solar absorptance in accordance with ASTM E903. Also available in a vacuum chamber compatible version, LPSR 300V.

- SRI 1000: Portable instrument for obtaining Solar Reflectance Index (SRI). The SRI 1000 measures thermal emittance as per ASTM E408 and solar reflectance at air mass zero (terrestrial applications) as ASTM C1549.These two measurements allow the calculation of the Solar Reflectance Index (SRI) as defined for environmental certifications such as Cool Roofs and LEED.
- TEMP 2000A:

Portable emissometer/reflectometer that measures total hemispherical reflectance, <3 to >35 micrometers wavelength. Provides both normal and hemispherical 300k (ambient) emittance measurements. The recognized replacement for the no longer produced Gier Dunkle DB 100 IR Reflectometer, with improved performance and maintainability and in accordance with the ASTM E408 standard

TESA 2000 Portable Reflectometer/Emissometer and Solar Absorption/Reflectometer in use
- TESA 2000: Portable emissometer/reflectometer combined with a solar reflectometer measures total hemispherical reflectance, <3 to >35 micrometers. Provides both normal and hemispherical 300k (ambient) emittance measurements. Improved performance and maintainability over the no longer produced Gier Dunkle DB 100 IR Reflectometer and in accordance with the ASTM E408 standard, and performs optically integrated total hemispheric reflectance measurement, 250 nm to 2500 nm (compact, light-weight, rugged for ease of field or lab use).
-SPECTRAFIRE: Far Infrared Reflectometer Attachment designed for theThermo-Nicolet line of FTIR spectometers. Measures total hemispherical spectral reflectance from 1.67 to 40 micrometers using a patented collector design. Room temperature reflectance data can be used to predict elevated temperatures.
Far Infrared Reflectometer
   

Note: terms reflectance, emittance and absorptance and terms reflectivity, emissivity and absorptivity are often used interchangeably.

 

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